Welcome to Hotenda.com Online Store!

logo
userjoin
Home

TC75S56FE,LM

TC75S56FE,LM

TC75S56FE,LM

Toshiba Semiconductor and Storage

Surface Mount Tape & Reel (TR) Linear Comparators 2014

SOT-23

TC75S56FE,LM Datasheet

non-compliant

In-Stock: 0 items
Specifications
Name Value
Type Parameter
Mounting Type Surface Mount
Package / Case SOT-553
Operating Temperature -40°C~85°C
Packaging Tape & Reel (TR)
Published 2014
Part Status Obsolete
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Type General Purpose
Output Type Push-Pull
Number of Elements 1
Voltage - Supply, Single/Dual (±) 1.8V~7V ±0.9V~3.5V
Current - Quiescent (Max) 22μA
Voltage - Input Offset (Max) 7mV @ 5V
Current - Input Bias (Max) 1pA
Current - Output (Typ) 18mA @ 5V
Propagation Delay (Max) 680ns
TC75S56FE,LM Product Details

TC75S56FE,LM Overview


The product is packaged in SOT-553 in order to facilitate transportation.Output type of this comparator is Push-Pull .We ship the part through Tape & Reel (TR) .This is a typical comparator of type General Purpose .There are a total of 1 elements in it.In general, mounting type Surface Mount is recommended.Electronic comparator is recommended that the operating temperature be set to -40°C~85°C in order to prevent malfunctions.

TC75S56FE,LM Features


Push-Pull output capability
General Purpose IC
Employing 1 elements
Operates under -40°C~85°C

TC75S56FE,LM Applications


There are a lot of Toshiba Semiconductor and Storage TC75S56FE,LM linear comparators applications.

  • Automatic Test Equipment
  • General Purpose Low Voltage Applications
  • Industrial
  • Limit Comparators
  • Infotainment and Clusters
  • Window Comparators, Multivibrators
  • Threshold Detectors
  • Wireless Base Stations
  • Lithium ion battery monitoring
  • Hand-Held Electronics

Related Part Number

TL712CDG4
TL712CDG4
$0 $/piece
MAX971CSA-T
MAX971CSA-T
$0 $/piece
TLC354CPWRG4
TSM971CUA+
TSM971CUA+
$0 $/piece
LMH7322SQX/NOPB
TLV3012AIDBVTG4
LM239PWRG4
LM239PWRG4
$0 $/piece

Get Subscriber

Enter Your Email Address, Get the Latest News