Automotive, AEC-Q100, FL1-K Memory IC Automotive, AEC-Q100, FL1-K Series
SOT-23
S25FL116K0XNFA010 Datasheet
non-compliant
In-Stock: 0 items
Specifications
Name
Value
Type
Parameter
Factory Lead Time
13 Weeks
Mounting Type
Surface Mount
Package / Case
8-WDFN Exposed Pad
Supplier Device Package
8-WSON (6x8)
Operating Temperature
-40°C~85°C TA
Packaging
Tray
Series
Automotive, AEC-Q100, FL1-K
Part Status
Obsolete
Moisture Sensitivity Level (MSL)
3 (168 Hours)
Technology
FLASH - NOR
Voltage - Supply
2.7V~3.6V
Memory Size
16Mb 2M x 8
Memory Type
Non-Volatile
Clock Frequency
108MHz
Memory Format
FLASH
Memory Interface
SPI - Quad I/O
Write Cycle Time - Word, Page
3ms
RoHS Status
ROHS3 Compliant
Pricing & Ordering
Quantity
Unit Price
Ext. Price
1
$1.07000
$1.07
10
$0.97400
$9.74
25
$0.94760
$23.69
50
$0.94260
$47.13
100
$0.84250
$84.25
490
$0.84000
$411.6
980
$0.81500
$798.7
1,470
$0.79200
$0.792
5,390
$0.73750
$3.6875
S25FL116K0XNFA010 Product Details
S25FL116K0XNFA010 Overview
A Non-Volatile-type memory can be classified as the memory type of this device. In addition, memory ics is available in a Tray case as well. Embedded in the 8-WDFN Exposed Pad case, memory ics is a single file. On the chip, there is an 16Mb 2M x 8 memory, which is the size of the chip's memory. There is a FLASH-format memory used in this device, which is the memory format used by mainstream devices. Featuring an extended operating temperature range of -40°C~85°C TA, this device allows it to be used in a variety of demanding applications. The device is capable of handling a supply voltage of 2.7V~3.6V volts. The recommended mounting type for memory ics is Surface Mount. A clock frequency rotation within 108MHz is used for the ic memory chip to rotate data. It is an important component of the Automotive, AEC-Q100, FL1-K series memory devices used in a variety of applications.
S25FL116K0XNFA010 Features
Package / Case: 8-WDFN Exposed Pad
S25FL116K0XNFA010 Applications
There are a lot of Cypress Semiconductor Corp S25FL116K0XNFA010 Memory applications.