Welcome to Hotenda.com Online Store!

logo
userjoin
Home

MT46H64M32L2JG-6:A TR

MT46H64M32L2JG-6:A TR

MT46H64M32L2JG-6:A TR

Micron Technology Inc.

Memory IC MT46H64M32

SOT-23

MT46H64M32L2JG-6:A TR Datasheet

non-compliant

In-Stock: 0 items
Specifications
Name Value
Type Parameter
Mounting Type Surface Mount
Package / Case 168-VFBGA
Operating Temperature 0°C~70°C TA
Packaging Tape & Reel (TR)
Published 2004
Part Status Discontinued
Moisture Sensitivity Level (MSL) 3 (168 Hours)
Technology SDRAM - Mobile LPDDR
Voltage - Supply 1.7V~1.95V
Base Part Number MT46H64M32
Memory Size 2Gb 64M x 32
Memory Type Volatile
Clock Frequency 166MHz
Access Time 5ns
Memory Format DRAM
Memory Interface Parallel
Write Cycle Time - Word, Page 15ns
RoHS Status ROHS3 Compliant
Pricing & Ordering
Quantity Unit Price Ext. Price
1,000 $27.79313 $27.79313
MT46H64M32L2JG-6:A TR Product Details

MT46H64M32L2JG-6:A TR Overview


As far as its memory type goes, it falls into the Volatile category. Tape & Reel (TR)-cases are available. In the case of 168-VFBGA, it is embedded within the case. 2Gb 64M x 32 is the chip's memory size. This device utilizes a DRAM format memory which is of mainstream design. Due to its wide temperature range of 0°C~70°C TA, this device is well suited to a wide range of applications that require high performance. A supply voltage of 1.7V~1.95V can be applied to it. The recommended mounting type for this device is Surface Mount. With a clock frequency of 166MHz, the memory rotates on its own. Similar parts are frequently selected using MT46H64M32, the device's base part number.

MT46H64M32L2JG-6:A TR Features


Package / Case: 168-VFBGA

MT46H64M32L2JG-6:A TR Applications


There are a lot of Micron Technology Inc. MT46H64M32L2JG-6:A TR Memory applications.

  • Cache memory
  • networks
  • cell phones
  • supercomputers
  • mainframes
  • personal digital assistants
  • eSRAM
  • eDRAM
  • nonvolatile BIOS memory
  • main computer memory

Related Part Number

Get Subscriber

Enter Your Email Address, Get the Latest News