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JAN1N4955D

  • JAN1N4955D
  • JAN1N4955D

JAN1N4955D

JAN1N4955D

Microsemi Corporation

ZENER DIODE 1.5Ohm ±1% 100μA @ 5.7V -65°C~175°C 2 Terminations E, Axial

SOT-23

JAN1N4955D Datasheet

non-compliant

In-Stock: 0 items
Specifications
Name Value
Type Parameter
Mounting Type Through Hole
Package / Case E, Axial
Surface Mount NO
Diode Element Material SILICON
Operating Temperature -65°C~175°C
Packaging Bulk
Series Military, MIL-PRF-19500/356
Published 2010
Tolerance ±1%
JESD-609 Code e0
Part Status Active
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Number of Terminations 2
ECCN Code EAR99
Terminal Finish Tin/Lead (Sn/Pb)
HTS Code 8541.10.00.50
Terminal Form WIRE
Peak Reflow Temperature (Cel) NOT SPECIFIED
Time@Peak Reflow Temperature-Max (s) NOT SPECIFIED
Pin Count 2
Reference Standard MIL-19500/356H
JESD-30 Code O-LALF-W2
Qualification Status Qualified
Number of Elements 1
Polarity UNIDIRECTIONAL
Configuration SINGLE
Power Dissipation-Max 5W
Diode Type ZENER DIODE
Current - Reverse Leakage @ Vr 100μA @ 5.7V
Voltage - Forward (Vf) (Max) @ If 1.5V @ 1A
Case Connection ISOLATED
Power - Max 5W
Impedance-Max 1.5Ohm
Reference Voltage 7.5V
Voltage - Zener (Nom) (Vz) 7.5V
Voltage Tol-Max 1%
Working Test Current 175mA
RoHS Status Non-RoHS Compliant
Pricing & Ordering
Quantity Unit Price Ext. Price
100 $15.89500 $1589.5
JAN1N4955D Product Details

JAN1N4955D Overview


An electrical device like this requires a reverse leakage current of 100μA @ 5.7V.A maximum voltage (Tol) can be supplied if 1% is set.While the device is operating, the maximum voltage - Zener (Nom) is reduced to 7.5V.This device must be operated with the working test voltage set to 175mA.For operation, diode reaches 1.5V @ 1A at the maximum voltage - Forward (Vf).

JAN1N4955D Features


reverse leakage current of 100μA @ 5.7V
100μA @ 5.7V is the maximum voltage (Tol)
the working test voltage to 175mA
minimal dynamic impedance is 175mA


JAN1N4955D Applications


There are a lot of Microsemi Corporation
JAN1N4955D applications of zener single diodes.


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