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74LV374D,112

74LV374D,112

74LV374D,112

NXP USA Inc.

1V~5.5V 77MHz D-Type Flip Flop 74LV374 160μA 74LV Series 20-SOIC (0.295, 7.50mm Width)

SOT-23

74LV374D,112 Datasheet

non-compliant

In-Stock: 0 items
Specifications
Name Value
Type Parameter
Mounting Type Surface Mount
Package / Case 20-SOIC (0.295, 7.50mm Width)
Operating Temperature -40°C~125°C TA
Packaging Tube
Published 2009
Series 74LV
Part Status Obsolete
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Type D-Type
Voltage - Supply 1V~5.5V
Base Part Number 74LV374
Function Standard
Output Type Tri-State, Non-Inverted
Number of Elements 1
Clock Frequency 77MHz
Current - Quiescent (Iq) 160μA
Current - Output High, Low 16mA 16mA
Number of Bits per Element 8
Max Propagation Delay @ V, Max CL 19ns @ 5V, 50pF
Trigger Type Positive Edge
Input Capacitance 3.5pF
RoHS Status ROHS3 Compliant
Pricing & Ordering
Quantity Unit Price Ext. Price
1 $0.15000 $0.15
500 $0.1485 $74.25
1000 $0.147 $147
1500 $0.1455 $218.25
2000 $0.144 $288
2500 $0.1425 $356.25
74LV374D,112 Product Details

74LV374D,112 Overview


It is packaged in the way of 20-SOIC (0.295, 7.50mm Width). You can find it in the Tubepackage. It is configured with Tri-State, Non-Invertedas an output. Positive Edgeis the trigger it is configured with. Surface Mountmounts this electrical part. The JK flip flop operates at a voltage of 1V~5.5V. Currently, the operating temperature is -40°C~125°C TA. It is an electronic flip flop with the type D-Type. The FPGA belongs to the 74LV series. It should not exceed 77MHzin terms of its output frequency. A total of 1elements are contained within it. Despite external influences, it consumes 160μAof quiescent current. You can search similar parts based on 74LV374. This T flip flop has a capacitance of 3.5pF farads at the input.

74LV374D,112 Features


Tube package
74LV series

74LV374D,112 Applications


There are a lot of NXP USA Inc. 74LV374D,112 Flip Flops applications.

  • Data transfer
  • Parallel data storage
  • Set-reset capability
  • Single Up Count-Control Line
  • Memory
  • Digital electronics systems
  • ESD performance
  • High Performance Logic for test systems
  • Shift Registers
  • Communications

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