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8745BYLF

8745BYLF

8745BYLF

Renesas Electronics America Inc.

Clock Generator 700MHz ICS8745 Clock Generators 32-LQFP Surface Mount 3.135V~3.465V Tray

SOT-23

8745BYLF Datasheet

non-compliant

In-Stock: 0 items
Specifications
Name Value
Type Parameter
Mounting Type Surface Mount
Package / Case 32-LQFP
Operating Temperature 0°C~70°C
Packaging Tray
Part Status Obsolete
Moisture Sensitivity Level (MSL) 3 (168 Hours)
Type Clock Generator
Voltage - Supply 3.135V~3.465V
Base Part Number ICS8745
Output LVDS
Number of Circuits 1
Frequency (Max) 700MHz
Input HCSL, LVDS, LVHSTL, LVPECL, SSTL
Ratio - Input:Output 2:5
PLL Yes with Bypass
Differential - Input:Output Yes/Yes
Pricing & Ordering
Quantity Unit Price Ext. Price
1 $13.670343 $13.670343
10 $12.896550 $128.9655
100 $12.166556 $1216.6556
500 $11.477884 $5738.942
1000 $10.828192 $10828.192
8745BYLF Product Details

8745BYLF Overview


As a clock IC, it is packaged by the Tray method. There is a clock generator embedded in the 32-LQFP package. There is a Clock PLL called HCSL, LVDS, LVHSTL, LVPECL, SSTL which is designed to be the input to this clock generator. To access the full performance of the electronic component, 1 circuits are implemented. It provides a maximum frequency of 700MHz. A Surface Mount-shaped electrical component makes it convenient to mount on a panel. This clock PLL works with a supply voltage of 3.135V~3.465V. Test statistics suggest setting the ambient temperature at 0°C~70°C, which is 0°C~70°C. This is a clock generator compatible with LVDS logic levels. As far as electrical parts go, this component can be classified as a Clock Generator component. Related electrical parts can be found for the base part number ICS8745.

8745BYLF Features


Available in the 32-LQFP

8745BYLF Applications


There are a lot of Renesas Electronics America Inc. 8745BYLF Clock Generators applications.

  • Instrument
  • Small signal recovery
  • Frequency synthesis
  • Infotainment systems
  • Myriad digital applications
  • Automatic test equipment
  • Wireless infrastructure
  • Test equipment
  • Deep space exploration
  • Peripheral devices

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