Welcome to Hotenda.com Online Store!

logo
userjoin
Home

2SB1204

2SB1204

2SB1204

SANYO SEMICONDUCTOR CO LTD

2SB1204 datasheet pdf and Unclassified product details from SANYO SEMICONDUCTOR CO LTD stock available on our website

SOT-23

2SB1204 Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Surface MountNO
Number of Terminals 3
Transistor Element Material SILICON
ECCN Code EAR99
HTS Code8541.29.00.75
Terminal Position SINGLE
Terminal FormTHROUGH-HOLE
Pin Count3
JESD-30 Code R-PSIP-T3
Number of Elements 1
Configuration SINGLE
Case Connection COLLECTOR
Transistor Application SWITCHING
Polarity/Channel Type PNP
Transition Frequency 130MHz
Collector Current-Max (IC) 8A
DC Current Gain-Min (hFE) 35
Collector-Emitter Voltage-Max 50V
In-Stock:4037 items

Pricing & Ordering

QuantityUnit PriceExt. Price
1$0.059040$0.05904
500$0.043412$21.706
1000$0.036176$36.176
2000$0.033189$66.378
5000$0.031018$155.09
10000$0.028854$288.54
15000$0.027905$418.575
50000$0.027439$1371.95

About 2SB1204

The 2SB1204 from SANYO SEMICONDUCTOR CO LTD is a high-performance microcontroller designed for a wide range of embedded applications. This component features 2SB1204 datasheet pdf and Unclassified product details from SANYO SEMICONDUCTOR CO LTD stock available on our website.

Key Features

  • Advanced AVR architecture for efficient processing
  • Wide operating temperature range: -40°C to 85°C
  • Low power consumption for energy-efficient applications
  • Comprehensive peripheral set including SPI, UART, and USART interfaces

Applications

This microcontroller is ideal for various applications including:

  • Industrial control systems
  • Consumer electronics
  • Automotive systems
  • IoT devices
  • Medical equipment

Technical Support

Hotenda provides comprehensive technical support for the 2SB1204, including datasheets, application notes, and design resources. Our team of engineers is available to assist with your design challenges.

Get Subscriber

Enter Your Email Address, Get the Latest News