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1N4967

1N4967

1N4967

Semtech Corporation

ZENER DIODE 5Ohm ±5% 2μA @ 18.2V -55°C~175°C 2 Terminations Axial

SOT-23

1N4967 Datasheet

non-compliant

In-Stock: 0 items
Specifications
Name Value
Type Parameter
Factory Lead Time 19 Weeks
Mounting Type Through Hole
Package / Case Axial
Surface Mount NO
Diode Element Material SILICON
Operating Temperature -55°C~175°C
Packaging Bulk
Tolerance ±5%
JESD-609 Code e0
Part Status Active
Moisture Sensitivity Level (MSL) Not Applicable
Number of Terminations 2
ECCN Code EAR99
Terminal Finish Tin/Lead (Sn/Pb)
Additional Feature LOW DYNAMIC IMPEDANCE
HTS Code 8541.10.00.50
Terminal Form WIRE
Peak Reflow Temperature (Cel) NOT SPECIFIED
Reach Compliance Code unknown
Time@Peak Reflow Temperature-Max (s) NOT SPECIFIED
Base Part Number 1N4967
Pin Count 2
JESD-30 Code O-XALF-W2
Qualification Status Not Qualified
Number of Elements 1
Polarity UNIDIRECTIONAL
Configuration SINGLE
Power Dissipation-Max 5W
Diode Type ZENER DIODE
Current - Reverse Leakage @ Vr 2μA @ 18.2V
Case Connection ISOLATED
Power - Max 5W
Impedance-Max 5Ohm
Reference Voltage 24V
Voltage - Zener (Nom) (Vz) 24V
Voltage Tol-Max 5%
Working Test Current 50mA
Reverse Current-Max 2μA
Dynamic Impedance-Max 3Ohm
Voltage Temp Coeff-Max 21.6mV/°C
RoHS Status Non-RoHS Compliant
Pricing & Ordering
Quantity Unit Price Ext. Price
250 $7.36100 $1840.25
1N4967 Product Details

1N4967 Overview


An electrical device like this requires a reverse leakage current of 2μA @ 18.2V.A maximum voltage (Tol) can be supplied if 5% is set.While the device is operating, the maximum voltage - Zener (Nom) is reduced to 24V.This device must be operated with the working test voltage set to 50mA.21.6mV/°C is reached when the temperature coefficient (Temp Coeff) reaches its maximum.

1N4967 Features


reverse leakage current of 2μA @ 18.2V
2μA @ 18.2V is the maximum voltage (Tol)
the working test voltage to 50mA
minimal dynamic impedance is 50mA


1N4967 Applications


There are a lot of Semtech Corporation
1N4967 applications of zener single diodes.


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