SN74ABT18504PM

new-10%

Manufacturer part number:SN74ABT18504PM

Manufacturer:Texas Instruments

Description:IC SCAN-TEST-DEV/TXRX 64-LQFP

Case Package:SOT-23

Datasheet:SN74ABT18504PM Datasheet

RoHs Status:non-compliant

Name	Value
Type	Parameter
Factory Lead Time	6 Weeks
Lifecycle Status	ACTIVE (Last Updated: 1 day ago)
Mount	Surface Mount
Mounting Type	Surface Mount
Package / Case	64-LQFP
Number of Pins	64
Weight	342.689036mg
Operating Temperature	-40°C~85°C
Packaging	Tray
Series	74ABT
JESD-609 Code	e4
Pbfree Code	yes
Part Status	Active
Moisture Sensitivity Level (MSL)	3 (168 Hours)
Number of Terminations	64
ECCN Code	EAR99
Terminal Finish	Nickel/Palladium/Gold (Ni/Pd/Au)
Additional Feature	WITH INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION; WITH CLOCK ENABLE
Technology	BICMOS
Terminal Position	QUAD
Terminal Form	GULL WING
Peak Reflow Temperature (Cel)	260
Number of Functions	1
Supply Voltage	4.5V~5.5V
Terminal Pitch	0.5mm
Base Part Number	74ABT18504
Pin Count	64
Operating Supply Voltage	5V
Number of Elements	1
Polarity	Non-Inverting
Power Supplies	5V
Max Supply Voltage	5.5V
Min Supply Voltage	4.5V
Load Capacitance	50pF
Number of Ports	2
Number of Bits	20
Propagation Delay	17 ns
Quiescent Current	36mA
Turn On Delay Time	17 ns
Family	ABT
Logic Function	Transceiver
Direction	Bidirectional
Output Characteristics	3-STATE
Logic Type	Scan Test Device with Universal Bus Transceivers
Prop. Delay@Nom-Sup	6.5 ns
High Level Output Current	-32mA
Low Level Output Current	64mA
Control Type	INDEPENDENT CONTROL
Power Supply Current-Max (ICC)	40mA
Translation	N/A
Height	1.6mm
Length	10mm
Width	10mm
Thickness	1.4mm
Radiation Hardening	No
RoHS Status	ROHS3 Compliant
Lead Free	Lead Free