SN74AHC273N Overview

20-DIP (0.300, 7.62mm)is the packaging method. It is contained within the Tubepackage. T flip flop uses Non-Invertedas the output. Positive Edgeis the trigger it is configured with. In this case, the electronic component is mounted in the way of Through Hole. The JK flip flop operates at 2V~5.5Vvolts. The operating temperature is -40°C~125°C TA. It belongs to the type D-Typeof flip flops. It belongs to the 74AHCseries of FPGAs. A frequency of 110MHzshould not be exceeded by its output. In total, it contains 1 elements. As a result, it consumes 4μA of quiescent current without being affected by external factors. A total of 20 terminations have been made. It is a member of the 74AHC273 family. A voltage of 3.3V is used as the power supply for this D latch. The input capacitance of this T flip flop is 2.5pF farads, which is defined as the capacitance between the input terminals of an op amp with either input grounded. It is a member of the AHC/VHC/H/U/Vfamily of D flip flop. It is mounted by the way of Through Hole. Basically, it is designed with a set of 20 pins. Edge triggering is a type of triggering that allows a circuit to become active at the positive edge or the negative edge of the clock signal. The clock edge trigger type of this device is Positive Edge. This RS flip flops is a part number FF/Latches. It is designed with a number of bits of 8. 5.5Vis the maximum supply voltage (Vsup). The supply voltage (Vsup) should be maintained above 2V for normal operation. 8 circuits are used to achieve its superior flexibility. The D latch runs on a voltage of 2/5.5V volts. In addition to its maximum design flexibility, the output current of the T flip flop is 8mA. It has 3lines.

SN74AHC273N Features

Tube package
74AHC series
20 pins
8 Bits
2/5.5V power supplies

SN74AHC273N Applications

There are a lot of Texas Instruments SN74AHC273N Flip Flops applications.

• ESD protection
• Bus hold
• Consumer
• Latch-up performance
• Frequency division
• Power down protection
• Single Up Count-Control Line
• High Performance Logic for test systems
• Buffered Clock
• ESCC