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SN74LVTH182512DGGR

SN74LVTH182512DGGR

SN74LVTH182512DGGR

Texas Instruments

IC SCAN-TEST-DEV/XCVR 64-TSSOP

SOT-23

SN74LVTH182512DGGR Datasheet

non-compliant

In-Stock: 0 items
Specifications
Name Value
Type Parameter
Factory Lead Time 6 Weeks
Lifecycle Status ACTIVE (Last Updated: 3 days ago)
Contact Plating Gold
Mount Surface Mount
Mounting Type Surface Mount
Package / Case 64-TFSOP (0.240, 6.10mm Width)
Number of Pins 64
Weight 262.601633mg
Operating Temperature -40°C~85°C
Packaging Tape & Reel (TR)
Series 74LVTH
JESD-609 Code e4
Pbfree Code yes
Part Status Active
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Number of Terminations 64
ECCN Code EAR99
Additional Feature WITH INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION
Packing Method TR
Technology CMOS
Terminal Position DUAL
Terminal Form GULL WING
Peak Reflow Temperature (Cel) 260
Number of Functions 2
Supply Voltage 2.7V~3.6V
Terminal Pitch 0.5mm
Base Part Number 74LVTH182512
Pin Count 64
Number of Elements 2
Polarity Non-Inverting
Power Supplies 3.3V
Max Supply Voltage 3.6V
Min Supply Voltage 2.7V
Number of Ports 2
Number of Bits 18
Propagation Delay 20 ns
Quiescent Current 18mA
Turn On Delay Time 20 ns
Family LVT
Logic Function Transceiver
Direction Bidirectional
Output Characteristics 3-STATE WITH SERIES RESISTOR
Logic Type ABT Scan Test Device With Universal Bus Transceivers
Prop. Delay@Nom-Sup 5.7 ns
Trigger Type POSITIVE EDGE
High Level Output Current -32mA
Low Level Output Current 64mA
Control Type INDEPENDENT CONTROL
Translation N/A
Height 1.2mm
Length 17mm
Width 6.1mm
Thickness 1.15mm
Radiation Hardening No
RoHS Status ROHS3 Compliant
Lead Free Lead Free
Pricing & Ordering
Quantity Unit Price Ext. Price
2,000 $4.44080 $8.8816

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