SN74LVTH182512DGGR

new-10%

Manufacturer part number:SN74LVTH182512DGGR

Manufacturer:Texas Instruments

Description:IC SCAN-TEST-DEV/XCVR 64-TSSOP

Case Package:SOT-23

Datasheet:SN74LVTH182512DGGR Datasheet

RoHs Status:non-compliant

Name	Value
Type	Parameter
Factory Lead Time	6 Weeks
Lifecycle Status	ACTIVE (Last Updated: 3 days ago)
Contact Plating	Gold
Mount	Surface Mount
Mounting Type	Surface Mount
Package / Case	64-TFSOP (0.240, 6.10mm Width)
Number of Pins	64
Weight	262.601633mg
Operating Temperature	-40°C~85°C
Packaging	Tape & Reel (TR)
Series	74LVTH
JESD-609 Code	e4
Pbfree Code	yes
Part Status	Active
Moisture Sensitivity Level (MSL)	1 (Unlimited)
Number of Terminations	64
ECCN Code	EAR99
Additional Feature	WITH INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION
Packing Method	TR
Technology	CMOS
Terminal Position	DUAL
Terminal Form	GULL WING
Peak Reflow Temperature (Cel)	260
Number of Functions	2
Supply Voltage	2.7V~3.6V
Terminal Pitch	0.5mm
Base Part Number	74LVTH182512
Pin Count	64
Number of Elements	2
Polarity	Non-Inverting
Power Supplies	3.3V
Max Supply Voltage	3.6V
Min Supply Voltage	2.7V
Number of Ports	2
Number of Bits	18
Propagation Delay	20 ns
Quiescent Current	18mA
Turn On Delay Time	20 ns
Family	LVT
Logic Function	Transceiver
Direction	Bidirectional
Output Characteristics	3-STATE WITH SERIES RESISTOR
Logic Type	ABT Scan Test Device With Universal Bus Transceivers
Prop. Delay@Nom-Sup	5.7 ns
Trigger Type	POSITIVE EDGE
High Level Output Current	-32mA
Low Level Output Current	64mA
Control Type	INDEPENDENT CONTROL
Translation	N/A
Height	1.2mm
Length	17mm
Width	6.1mm
Thickness	1.15mm
Radiation Hardening	No
RoHS Status	ROHS3 Compliant
Lead Free	Lead Free