TC75S67TU,LF Description

Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).

TC75S67TU,LF Features

Ultra Low Noise. VNI = 6 nV/√Hz (typ.) @ VDD = 2.5 V

Low-current supply. 430 μA (typ.) @ VDD = 2.5 V

Ultra-compact package.

TC75S67TU,LF Applications

Temperature Measurement

Pressure Measurement

Flow Meters

Factory Automation and Process Control