Welcome to Hotenda.com Online Store!

logo
userjoin
Home

ZL40260QGG1

ZL40260QGG1

ZL40260QGG1

Microchip Technology

1 Circuit 1.6GHz 2:10 Clock Buffer 32-TQFP Exposed Pad

SOT-23

ZL40260QGG1 Datasheet

non-compliant

In-Stock: 0 items
Specifications
Name Value
Type Parameter
Factory Lead Time 8 Weeks
Mounting Type Surface Mount
Package / Case 32-TQFP Exposed Pad
Supplier Device Package 32-eTQFP (7x7)
Operating Temperature -40°C~85°C TA
Packaging Tray
Part Status Active
Moisture Sensitivity Level (MSL) 3 (168 Hours)
Type Fanout Buffer (Distribution), Multiplexer
Voltage - Supply 2.375V~2.625V 3.135V~3.465V
Output LVPECL
Number of Circuits 1
Frequency (Max) 1.6GHz
Input CML, HCSL, LVCMOS, LVDS, LVPECL, SSTL
Ratio - Input:Output 2:10
Differential - Input:Output Yes/Yes
RoHS Status ROHS3 Compliant
Pricing & Ordering
Quantity Unit Price Ext. Price
1 $6.66000 $6.66
500 $6.5934 $3296.7
1000 $6.5268 $6526.8
1500 $6.4602 $9690.3
2000 $6.3936 $12787.2
2500 $6.327 $15817.5
ZL40260QGG1 Product Details

ZL40260QGG1 Overview


It is package in 32-TQFP Exposed Pad case. In case Tray, the cut smart buffer is available. It is normal to operate with a value of 1.6GHz. Consequently, it will be mounted by Surface Mount. An electronic component classified as Fanout Buffer (Distribution), Multiplexer is categorized as such. Setting the temperature to -40°C~85°C TA will ensure reliable performance. Ideally, it should be able to operate from 2.375V~2.625V 3.135V~3.465V volts. As a result, the output is LVPECL.

ZL40260QGG1 Features


The operating temperature of -40°C~85°C TA degrees

ZL40260QGG1 Applications


There are a lot of Microchip Technology ZL40260QGG1 Clock Buffers & Drivers applications.

  • Zero crossing detector
  • Telecommunications
  • Smartphone
  • Clock signal level shifting
  • Window comparator
  • Cloud computing
  • Automatic test equipment
  • Storage area network
  • DDR4 JEDEC standard LRDIMM design
  • Mobile Internet Device (MID)

Related Part Number

Get Subscriber

Enter Your Email Address, Get the Latest News