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74ABT377CMTCX

74ABT377CMTCX

74ABT377CMTCX

ON Semiconductor

4.5V~5.5V 200MHz D-Type Flip Flop 74ABT377 50μA 74ABT Series 20-TSSOP (0.173, 4.40mm Width)

SOT-23

74ABT377CMTCX Datasheet PDF

non-compliant

Technical Specifications

Parameter NameValue
TypeParameter
Mounting Type Surface Mount
Package / Case 20-TSSOP (0.173, 4.40mm Width)
Supplier Device Package 20-TSSOP
Operating Temperature-40°C~85°C TA
PackagingTape & Reel (TR)
Series 74ABT
Part StatusObsolete
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Type D-Type
Voltage - Supply 4.5V~5.5V
Base Part Number 74ABT377
Function Standard
Output Type Non-Inverted
Number of Elements 1
Clock Frequency 200MHz
Current - Quiescent (Iq) 50μA
Current - Output High, Low 32mA 64mA
Number of Bits per Element 8
Max Propagation Delay @ V, Max CL 6.8ns @ 5V, 50pF
Trigger Type Positive Edge
Input Capacitance5pF
In-Stock:3632 items

74ABT377CMTCX Product Details

74ABT377CMTCX Overview


20-TSSOP (0.173, 4.40mm Width)is the way it is packaged. There is an embedded version in the package Tape & Reel (TR). T flip flop is configured with an output of Non-Inverted. It is configured with the trigger Positive Edge. Surface Mountis positioned in the way of this electronic part. A supply voltage of 4.5V~5.5V is required for operation. Currently, the operating temperature is -40°C~85°C TA. Logic flip flops of this type are classified as D-Type. In this case, it is a type of FPGA belonging to the 74ABT series. There should be no greater frequency than 200MHzon its output. A total of 1 elements are present. Despite external influences, it consumes 50μAof quiescent current. D latch belongs to the 74ABT377 family. This T flip flop has a capacitance of 5pF farads at the input.

74ABT377CMTCX Features


Tape & Reel (TR) package
74ABT series

74ABT377CMTCX Applications


There are a lot of ON Semiconductor 74ABT377CMTCX Flip Flops applications.

  • Computing
  • Divide a clock signal by 2 or 4
  • Convert a momentary switch to a toggle switch
  • Automotive
  • Load Control
  • Buffer registers
  • ESD performance
  • High Performance Logic for test systems
  • Reduced system switching noise
  • Dynamic threshold performance

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