IRF820 datasheet pdf and Transistors - FETs, MOSFETs - Single product details from STMicroelectronics stock available on our website
SOT-23
IRF820 Datasheet
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Specifications
Name
Value
Type
Parameter
Mount
Through Hole
Mounting Type
Through Hole
Package / Case
TO-220-3
Transistor Element Material
SILICON
Operating Temperature
150°C TJ
Packaging
Tube
Series
PowerMESH™ II
JESD-609 Code
e3
Part Status
Obsolete
Moisture Sensitivity Level (MSL)
1 (Unlimited)
Number of Terminations
3
Terminal Finish
Matte Tin (Sn)
Additional Feature
HIGH VOLTAGE
Subcategory
FET General Purpose Power
Voltage - Rated DC
500V
Technology
MOSFET (Metal Oxide)
Current Rating
2.5A
Base Part Number
IRF8
Pin Count
3
JESD-30 Code
R-PSIP-T3
Number of Elements
1
Power Dissipation-Max
80W Tc
Element Configuration
Single
Operating Mode
ENHANCEMENT MODE
Power Dissipation
80W
Turn On Delay Time
10 ns
FET Type
N-Channel
Transistor Application
SWITCHING
Rds On (Max) @ Id, Vgs
3 Ω @ 1.5A, 10V
Vgs(th) (Max) @ Id
4V @ 250μA
Input Capacitance (Ciss) (Max) @ Vds
315pF @ 25V
Current - Continuous Drain (Id) @ 25°C
4A Tc
Gate Charge (Qg) (Max) @ Vgs
17nC @ 10V
Rise Time
13ns
Drive Voltage (Max Rds On,Min Rds On)
10V
Vgs (Max)
±30V
Fall Time (Typ)
13 ns
Continuous Drain Current (ID)
4A
JEDEC-95 Code
TO-220AB
Gate to Source Voltage (Vgs)
30V
Drain Current-Max (Abs) (ID)
4A
Drain-source On Resistance-Max
3Ohm
Drain to Source Breakdown Voltage
500V
Pulsed Drain Current-Max (IDM)
12A
Avalanche Energy Rating (Eas)
210 mJ
Feedback Cap-Max (Crss)
50 pF
Turn Off Time-Max (toff)
245ns
Turn On Time-Max (ton)
137ns
Radiation Hardening
No
RoHS Status
Non-RoHS Compliant
Lead Free
Contains Lead
Pricing & Ordering
Quantity
Unit Price
Ext. Price
IRF820 Product Details
Description
The IRF820 is an N-channel 500V - 2.5? - 4A TO-220 PowerMesh?II MOSFET. The initial generation of MESH OVERLAY? has evolved into the PowerMESH?II. The layout improvements made significantly raise the Ron*area figure of merit while maintaining the device's leadership position in terms of switching speed, gate charge, and robustness.