SN74BCT374NSR Overview

The flip flop is packaged in a case of 20-SOIC (0.209, 5.30mm Width). As part of the package Cut Tape (CT), it is embedded. There is a Tri-State, Non-Invertedoutput configured with it. JK flip flop uses Positive Edgeas the trigger. There is an electrical part that is mounted in the way of Surface Mount. It operates with a supply voltage of 4.5V~5.5V. It is at 0°C~70°C TAdegrees Celsius that the system is operating. It belongs to the type D-Typeof flip flops. It is a type of FPGA belonging to the 74BCT series. It should not exceed 70MHzin its output frequency. A total of 1 elements are present. It consumes 5mA of quiescent current without being affected by external factors. The number of terminations is 20. It is a member of the 74BCT374 family. A voltage of 5V is used to power it. There is 6pF input capacitance for this T flip flop. It belongs to the family of electronic devices known as BCT/FBT. In this case, the electronic component is mounted in the way of Surface Mount. The 20pins are designed into the board. There is a clock edge trigger type of Positive Edgeon this device. The part is included in FF/Latches. An electronic part designed with 8bits is used in this application. Due to its superior flexibility, it uses 8 circuits. As a result of its reliability, this D flip flop is ideally suited for TR. The D latch runs on a voltage of 5V volts. A D flip flop with 2embedded ports is available. In order to achieve high efficiency, the supply voltage should be maintained at 5V. As a result of its output current of 64mA, it is very flexible in terms of design. There are no output lines on the JK flip flop.

SN74BCT374NSR Features

Cut Tape (CT) package
74BCT series
20 pins
8 Bits
5V power supplies

SN74BCT374NSR Applications

There are a lot of Texas Instruments SN74BCT374NSR Flip Flops applications.

• Divide a clock signal by 2 or 4
• Storage registers
• ESD protection
• Automotive
• Shift registers
• Test & Measurement
• Common Clocks
• Latch-up performance
• Safety Clamp
• High Performance Logic for test systems