SN74LV175APW Overview

The package is in the form of 16-TSSOP (0.173, 4.40mm Width). You can find it in the Tubepackage. As configured, the output uses Differential. It is configured with a trigger that uses a value of Positive Edge. Surface Mountis positioned in the way of this electronic part. The JK flip flop operates at 2V~5.5Vvolts. It is at -40°C~85°C TAdegrees Celsius that the system is operating. The type of this D latch is D-Type. The FPGA belongs to the 74LV series. There should be no greater frequency than 165MHzon its output. D latch consists of 1 elements. It consumes 20μA of quiescent current without being affected by external factors. There are 16 terminations, which are the practice of ending a transmission line with a device that matches the characteristic impedance of the line. Members of the 74LV175family make up this object. A voltage of 2.5V is used to power it. This JK flip flop has a 1.4pFfarad input capacitance. A device of this type belongs to the family of LV/LV-A/LVX/H. The electronic part is mounted in the way of Surface Mount. This board has 16 pins. It has a clock edge trigger type of Positive Edge. The RS flip flops belongs to FF/Latches base part number. 4bits are used in its design. It reaches 5.5Vwhen the supply voltage is maximal (Vsup). Normally, the supply voltage (Vsup) should be above 2V. The system runs on a power supply of 3.3V watts. The 12mA output current allows it to be designed with the greatest amount of flexibility. There are 2 output Lines, which generate the binary equivalent of the input line whose value is equal to “1” and are available to encode either a decimal or hexadecimal input pattern to typically a binary or “B. C. D” (binary coded decimal) output code. It is of 4 channels.

SN74LV175APW Features

Tube package
74LV series
16 pins
4 Bits
3.3V power supplies

SN74LV175APW Applications

There are a lot of Texas Instruments SN74LV175APW Flip Flops applications.

• Counters
• 2 – Bit synchronous counter
• Individual Asynchronous Resets
• Load Control
• High Performance Logic for test systems
• Power down protection
• Registers
• Automotive
• Pattern generators
• Memory