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PI74FCT162374ATA

PI74FCT162374ATA

PI74FCT162374ATA

Diodes Incorporated

4.5V~5.5V D-Type Flip Flop 74FCT162374 500μA 74FCT Series 48-TFSOP (0.240, 6.10mm Width)

SOT-23

PI74FCT162374ATA Datasheet

non-compliant

In-Stock: 0 items
Specifications
Name Value
Type Parameter
Mounting Type Surface Mount
Package / Case 48-TFSOP (0.240, 6.10mm Width)
Operating Temperature -40°C~85°C TA
Packaging Tube
Series 74FCT
Part Status Obsolete
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Type D-Type
Voltage - Supply 4.5V~5.5V
Base Part Number 74FCT162374
Function Standard
Output Type Tri-State, Non-Inverted
Number of Elements 2
Current - Quiescent (Iq) 500μA
Current - Output High, Low 24mA 24mA
Number of Bits per Element 8
Max Propagation Delay @ V, Max CL 6.5ns @ 5V, 50pF
Trigger Type Positive Edge
Input Capacitance 4.5pF
RoHS Status Non-RoHS Compliant
PI74FCT162374ATA Product Details

PI74FCT162374ATA Overview


The flip flop is packaged in 48-TFSOP (0.240, 6.10mm Width). It is included in the package Tube. As configured, the output uses Tri-State, Non-Inverted. It is configured with a trigger that uses a value of Positive Edge. It is mounted in the way of Surface Mount. It operates with a supply voltage of 4.5V~5.5V. It is at -40°C~85°C TAdegrees Celsius that the system is operating. It belongs to the type D-Typeof flip flops. The 74FCTseries comprises this type of FPGA. D latch consists of 2 elements. As a result, it consumes 500μA of quiescent current without being affected by external factors. The 74FCT162374 family contains this object. The input capacitance of this T flip flop is 4.5pF farads, which is defined as the capacitance between the input terminals of an op amp with either input grounded.

PI74FCT162374ATA Features


Tube package
74FCT series

PI74FCT162374ATA Applications


There are a lot of Diodes Incorporated PI74FCT162374ATA Flip Flops applications.

  • Communications
  • CMOS Process
  • Supports Live Insertion
  • Storage registers
  • Synchronous counter
  • Dynamic threshold performance
  • Parallel data storage
  • High Performance Logic for test systems
  • Clock pulse
  • Individual Asynchronous Resets

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