CD4076BNSRE4 Overview

The flip flop is packaged in a case of 16-SOIC (0.209, 5.30mm Width). Package Tape & Reel (TR)embeds it. T flip flop uses Tri-State, Non-Invertedas its output configuration. This trigger is configured to use Positive Edge. There is an electric part mounted in the way of Surface Mount. A voltage of 3V~18Vis required for its operation. Temperature is set to -55°C~125°C TA. D-Typeis the type of this D latch. In terms of FPGAs, it belongs to the 4000B series. This D flip flop should not have a frequency greater than 16MHz. A total of 1elements are contained within it. There is 20μA quiescent consumption. There are 16 terminations, which are the practice of ending a transmission line with a device that matches the characteristic impedance of the line. You can search similar parts based on CD4076. It is powered by a voltage of 5V . The input capacitance of this T flip flop is 5pF farads, which is defined as the capacitance between the input terminals of an op amp with either input grounded. Electronic part Surface Mountis mounted in the way. A total of 16pins are provided on this board. There is a clock edge trigger type of Positive Edgeon this device. It is included in FF/Latches. There are 4bits in its design. It is imperative that the supply voltage (Vsup) is maintained above 3Vin order to ensure normal operation. A reliable performance of this D flip flop makes it well suited for use in TAPE AND REEL. It offers maximum design flexibility with its output current of 6.8mA. There are 4 input Lines, which consist of an electronic circuit connected between the ac mains and the rectifier input stage of the switching power supply.

CD4076BNSRE4 Features

Tape & Reel (TR) package
4000B series
16 pins
4 Bits

CD4076BNSRE4 Applications

There are a lot of Texas Instruments CD4076BNSRE4 Flip Flops applications.

• Balanced Propagation Delays
• Registers
• Dynamic threshold performance
• Buffer registers
• Set-reset capability
• Frequency division
• Latch-up performance
• Data transfer
• High Performance Logic for test systems
• Shift Registers