SN74ABT534ADWR Overview

The item is packaged in 20-SOIC (0.295, 7.50mm Width)cases. The Tape & Reel (TR)package contains it. T flip flop uses Tri-State, Invertedas its output configuration. There is a trigger configured with Positive Edge. Surface Mountis positioned in the way of this electronic part. A supply voltage of 4.5V~5.5V is required for operation. In the operating environment, the temperature is -40°C~85°C TA. This electronic flip flop is of type D-Type. This type of FPGA is a part of the 74ABT series. A frequency of 175MHzshould be the maximum output frequency. D latch consists of 1 elements. During its operation, it consumes 250μA quiescent energy. There have been 20 terminations. It is a member of the 74ABT534 family. A voltage of 5V is used as the power supply for this D latch. Input capacitance of this device is 3.5pF farads. It belongs to the family of electronic devices known as ABT. Surface Mount mounts this electronic component. As you can see from the design, it has pins with 20. In this device, the clock edge trigger type is Positive Edge. The part is included in FF/Latches. An electronic part designed with 8bits is used in this application. Despite its superior flexibility, it relies on 8 circuits to achieve it. In light of its reliable performance, this T flip flop is well suited for TR. A power supply of 5Vis required to operate it. There are 2 terminations, which are the practice of ending a transmission line with a device that matches the characteristic impedance of the line. For high efficiency, the supply voltage should be set to 5V. The output current of 64mA makes it feature maximum design flexibility. The JK flip flop is with 3 output lines to operate.

SN74ABT534ADWR Features

Tape & Reel (TR) package
74ABT series
20 pins
8 Bits
5V power supplies

SN74ABT534ADWR Applications

There are a lot of Texas Instruments SN74ABT534ADWR Flip Flops applications.

• Consumer
• ESD protection
• Control circuits
• Automotive
• Shift Registers
• Count Modes
• Matched Rise and Fall
• Communications
• Computing
• High Performance Logic for test systems