SN74HC174D Overview

As a result, it is packaged as 16-SOIC (0.154, 3.90mm Width). D flip flop is embedded in the Tube package. As configured, the output uses Non-Inverted. The trigger it is configured with uses Positive Edge. The electronic part is mounted in the way of Surface Mount. It operates with a supply voltage of 2V~6V. It is operating at a temperature of -40°C~85°C TA. D-Typeis the type of this D latch. JK flip flop belongs to the 74HCseries of FPGAs. You should not exceed 50MHzin the output frequency of the device. In total, it contains 1 elements. T flip flop consumes 8μA quiescent energy. The 74HC174family includes it. A JK flip flop with a 3pFfarad input capacitance is used here. There is an electronic part mounted in the way of Surface Mount. A total of 16pins are provided on this board. Edge triggering is a type of triggering that allows a circuit to become active at the positive edge or the negative edge of the clock signal. The clock edge trigger type of this device is Positive Edge. It is designed with 6bits. Despite its superior flexibility, it relies on 7 circuits to achieve it. For high efficiency, the supply voltage should be set to 5V. This T flip flop features a maximum design flexibility due to its output current of 5.2mA. In order to operate, the chip has 1 output lines. It has 3lines. Quiescent current is consumed by the D latch in the amount of 8μA. High level output current is set to -5.2mA. It is set to 5.2mAfor low level output current. A temperature below 85°Cshould be used for operation. It should be higher than -40°Cwhen the system is operating. The RS flip flop is designed to operate with a minimal supply voltage of 2VV. 6Vis the maximum supply voltage it supports. The frequency can be set to 29MHz. A total of 6 channels are available.

SN74HC174D Features

Tube package
74HC series
16 pins
6 Bits

SN74HC174D Applications

There are a lot of Texas Instruments SN74HC174D Flip Flops applications.

• Shift registers
• ESD performance
• Event Detectors
• Buffered Clock
• Memory
• Bounce elimination switch
• Storage Registers
• CMOS Process
• Registers
• Dynamic threshold performance