IRG7PSH50UDPBF datasheet pdf and Transistors - IGBTs - Single product details from Infineon Technologies stock available on our website
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IRG7PSH50UDPBF Datasheet
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Specifications
Name
Value
Type
Parameter
Mount
Through Hole
Mounting Type
Through Hole
Package / Case
TO-247-3
Number of Pins
247
Transistor Element Material
SILICON
Operating Temperature
-55°C~150°C TJ
Packaging
Tube
Published
2010
JESD-609 Code
e3
Part Status
Obsolete
Moisture Sensitivity Level (MSL)
1 (Unlimited)
Number of Terminations
3
ECCN Code
EAR99
Terminal Finish
MATTE TIN OVER NICKEL
Subcategory
Insulated Gate BIP Transistors
Max Power Dissipation
462W
Peak Reflow Temperature (Cel)
260
[email protected] Reflow Temperature-Max (s)
40
JESD-30 Code
R-PSFM-T3
Number of Elements
1
Rise Time-Max
60ns
Element Configuration
Single
Case Connection
COLLECTOR
Input Type
Standard
Power - Max
462W
Transistor Application
POWER CONTROL
Polarity/Channel Type
N-CHANNEL
Collector Emitter Voltage (VCEO)
2V
Max Collector Current
116A
Reverse Recovery Time
190 ns
Collector Emitter Breakdown Voltage
1.2kV
Voltage - Collector Emitter Breakdown (Max)
1200V
Turn On Time
70 ns
Test Condition
600V, 50A, 5 Ω, 15V
Vce(on) (Max) @ Vge, Ic
2V @ 15V, 50A
Turn Off Time-Nom (toff)
650 ns
IGBT Type
Trench
Gate Charge
440nC
Current - Collector Pulsed (Icm)
150A
Td (on/off) @ 25°C
35ns/430ns
Switching Energy
3.6mJ (on), 2.2mJ (off)
Gate-Emitter Voltage-Max
30V
Gate-Emitter Thr Voltage-Max
6V
Fall Time-Max (tf)
65ns
Radiation Hardening
No
RoHS Status
RoHS Compliant
Lead Free
Lead Free
IRG7PSH50UDPBF Product Details
IRG7PSH50UDPBF Description
IRG7PSH50UDPBF is a type of insulated gate bipolar transistor with an ultrafast soft recovery diode, which is designed based on low VCE (ON) trench IGBT technology. Due to low VCE (ON) and low switching losses, it is ideally suitable for a wide range of switching frequencies. Increased reliability can be ensured based on rugged transient performance. Moreover, the IRG7PSH50UDPBF IGBT is able to deliver excellent current sharing in parallel operation and tight parameter distribution.