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MC74HC374AFG

MC74HC374AFG

MC74HC374AFG

Rochester Electronics, LLC

2V~6V 35MHz D-Type Flip Flop 4μA 74HC Series 20-SOIC (0.209, 5.30mm Width)

SOT-23

MC74HC374AFG Datasheet

non-compliant

In-Stock: 0 items
Specifications
Name Value
Type Parameter
Mounting Type Surface Mount
Package / Case 20-SOIC (0.209, 5.30mm Width)
Supplier Device Package SOEIAJ-20
Operating Temperature -55°C~125°C TA
Packaging Tube
Series 74HC
Part Status Obsolete
Moisture Sensitivity Level (MSL) 3 (168 Hours)
Type D-Type
Voltage - Supply 2V~6V
Function Standard
Output Type Tri-State, Non-Inverted
Number of Elements 1
Clock Frequency 35MHz
Current - Quiescent (Iq) 4μA
Current - Output High, Low 7.8mA 7.8mA
Number of Bits per Element 8
Max Propagation Delay @ V, Max CL 21ns @ 6V, 50pF
Trigger Type Positive Edge
Input Capacitance 10pF
RoHS Status ROHS3 Compliant
Pricing & Ordering
Quantity Unit Price Ext. Price
1 $0.40000 $0.4
500 $0.396 $198
1000 $0.392 $392
1500 $0.388 $582
2000 $0.384 $768
2500 $0.38 $950
MC74HC374AFG Product Details

MC74HC374AFG Overview


20-SOIC (0.209, 5.30mm Width)is the packaging method. D flip flop is included in the Tubepackage. As configured, the output uses Tri-State, Non-Inverted. Positive Edgeis the trigger it is configured with. This electronic part is mounted in the way of Surface Mount. The JK flip flop operates at 2V~6Vvolts. Temperature is set to -55°C~125°C TA. The type of this D latch is D-Type. In FPGA terms, D flip flop is a type of 74HCseries FPGA. There should be no greater frequency than 35MHzon its output. In total, there are 1 elements. There is 4μA quiescent consumption. Input capacitance of this device is 10pF farads.

MC74HC374AFG Features


Tube package
74HC series

MC74HC374AFG Applications


There are a lot of Rochester Electronics, LLC MC74HC374AFG Flip Flops applications.

  • ESCC
  • Computing
  • Latch-up performance
  • Cold spare funcion
  • Dynamic threshold performance
  • Automotive
  • Synchronous counter
  • Patented noise
  • Data Synchronizers
  • High Performance Logic for test systems

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