SN74BCT374DW Overview

As a result, it is packaged as 20-SOIC (0.295, 7.50mm Width). Package Tubeembeds it. T flip flop uses Tri-State, Non-Invertedas the output. This trigger is configured to use Positive Edge. Surface Mountmounts this electrical part. The JK flip flop operates with an input voltage of 4.5V~5.5V volts. A temperature of 0°C~70°C TAis used in the operation. D-Typedescribes this flip flop. It belongs to the 74BCTseries of FPGAs. In order for it to function properly, its output frequency should not exceed 70MHz. A total of 1 elements are present. There is a consumption of 5mAof quiescent energy. There have been 20 terminations. You can search similar parts based on 74BCT374. A voltage of 5V provides power to the D latch. A 6pFfarad input capacitance is provided by this T flip flop. It belongs to the family of electronic devices known as BCT/FBT. The electronic part is mounted in the way of Surface Mount. With its 20pins, it is designed to work with most electronic flip flops. Edge triggering is a type of triggering that allows a circuit to become active at the positive edge or the negative edge of the clock signal. The clock edge trigger type of this device is Positive Edge. There is a FF/Latchesbase part number assigned to the RS flip flops. This flip flop is designed with 8 Bits. Due to its superior flexibility, it uses 8 circuits. A power supply of 5Vis required to operate it. This flip flop has a total of 2ports. A high level of efficiency can be achieved by maintaining the supply voltage at 5V. This T flip flop features a maximum design flexibility due to its output current of 64mA. There are 3 output lines on it.

SN74BCT374DW Features

Tube package
74BCT series
20 pins
8 Bits
5V power supplies

SN74BCT374DW Applications

There are a lot of Texas Instruments SN74BCT374DW Flip Flops applications.

• Balanced 24 mA output drivers
• Individual Asynchronous Resets
• Single Down Count-Control Line
• Load Control
• EMI reduction circuitry
• Automotive
• Counters
• Computers
• High Performance Logic for test systems
• Reduced system switching noise