IRG4BC30U-S datasheet pdf and Transistors - IGBTs - Single product details from Infineon Technologies stock available on our website
SOT-23
IRG4BC30U-S Datasheet
non-compliant
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Specifications
Name
Value
Type
Parameter
Mounting Type
Surface Mount
Package / Case
TO-263-3, D2Pak (2 Leads + Tab), TO-263AB
Surface Mount
YES
Transistor Element Material
SILICON
Operating Temperature
-55°C~150°C TJ
Packaging
Tube
Published
1998
JESD-609 Code
e3
Part Status
Obsolete
Moisture Sensitivity Level (MSL)
1 (Unlimited)
Number of Terminations
2
ECCN Code
EAR99
Terminal Finish
Matte Tin (Sn) - with Nickel (Ni) barrier
Subcategory
Insulated Gate BIP Transistors
Terminal Position
SINGLE
Terminal Form
GULL WING
Peak Reflow Temperature (Cel)
260
[email protected] Reflow Temperature-Max (s)
30
JESD-30 Code
R-PSSO-G2
Qualification Status
Not Qualified
Number of Elements
1
Configuration
SINGLE
Case Connection
COLLECTOR
Input Type
Standard
Power - Max
100W
Transistor Application
POWER CONTROL
Polarity/Channel Type
N-CHANNEL
Voltage - Collector Emitter Breakdown (Max)
600V
Current - Collector (Ic) (Max)
23A
Power Dissipation-Max (Abs)
100W
Turn On Time
33 ns
Test Condition
480V, 12A, 23 Ω, 15V
Vce(on) (Max) @ Vge, Ic
2.1V @ 15V, 12A
Turn Off Time-Nom (toff)
320 ns
Gate Charge
50nC
Current - Collector Pulsed (Icm)
92A
Td (on/off) @ 25°C
17ns/78ns
Switching Energy
160μJ (on), 200μJ (off)
Gate-Emitter Voltage-Max
20V
Gate-Emitter Thr Voltage-Max
6V
Fall Time-Max (tf)
150ns
RoHS Status
Non-RoHS Compliant
IRG4BC30U-S Product Details
IRG4BC30U-S Description
IRG4BC30U-S is a kind of insulated gate bipolar transistor (IGBT) with ultrafast, ultra-soft-recovery anti-parallel diode, which is designed to be a "drop-in" replacement for equivalent industry-standard Generation 3 IR IGBTs. It is optimized for high operating frequencies 8-40 kHz in hard switching, and>200 kHz in resonant mode. As a generation-4 IGBT, It offers tighter parameter distribution and higher efficiency than generation 3. It is co-packaged with HEXFRED? diode for use in bridge configurations.