STGB30V60DF datasheet pdf and Transistors - IGBTs - Single product details from STMicroelectronics stock available on our website
SOT-23
STGB30V60DF Datasheet
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Specifications
Name
Value
Type
Parameter
Factory Lead Time
20 Weeks
Mount
Surface Mount
Mounting Type
Surface Mount
Package / Case
TO-263-3, D2Pak (2 Leads + Tab), TO-263AB
Weight
2.240009g
Transistor Element Material
SILICON
Operating Temperature
-55°C~175°C TJ
Packaging
Cut Tape (CT)
Part Status
Active
Moisture Sensitivity Level (MSL)
1 (Unlimited)
Number of Terminations
2
ECCN Code
EAR99
Subcategory
Insulated Gate BIP Transistors
Max Power Dissipation
258W
Terminal Form
GULL WING
Peak Reflow Temperature (Cel)
NOT SPECIFIED
[email protected] Reflow Temperature-Max (s)
NOT SPECIFIED
Base Part Number
STGB30
JESD-30 Code
R-PSSO-G2
Number of Elements
1
Element Configuration
Single
Case Connection
COLLECTOR
Input Type
Standard
Power - Max
258W
Transistor Application
POWER CONTROL
Polarity/Channel Type
N-CHANNEL
Collector Emitter Voltage (VCEO)
600V
Max Collector Current
60A
Reverse Recovery Time
53 ns
Collector Emitter Breakdown Voltage
600V
Collector Emitter Saturation Voltage
1.85V
Max Breakdown Voltage
600V
Turn On Time
59 ns
Test Condition
400V, 30A, 10 Ω, 15V
Vce(on) (Max) @ Vge, Ic
2.3V @ 15V, 30A
Turn Off Time-Nom (toff)
225 ns
IGBT Type
Trench Field Stop
Gate Charge
163nC
Current - Collector Pulsed (Icm)
120A
Td (on/off) @ 25°C
45ns/189ns
Switching Energy
383μJ (on), 233μJ (off)
Gate-Emitter Voltage-Max
20V
RoHS Status
ROHS3 Compliant
Pricing & Ordering
Quantity
Unit Price
Ext. Price
1,000
$2.26590
$2.2659
2,000
$2.17035
$4.3407
STGB30V60DF Product Details
STGB30V60DF Description
The STGB30V60DF device is an IGBT developed using an advanced proprietary trench gate field stop structure. The device is part of the V series of IGBTs, which represent an optimum compromise between conduction and switching losses to maximize the efficiency of very high frequency converters. Furthermore, a positive VCE(sat) temperature coefficient and very tight parameter distribution result in safer paralleling operation.