STGW25M120DF3 datasheet pdf and Transistors - IGBTs - Single product details from STMicroelectronics stock available on our website
SOT-23
STGW25M120DF3 Datasheet
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Specifications
Name
Value
Type
Parameter
Factory Lead Time
30 Weeks
Lifecycle Status
ACTIVE (Last Updated: 8 months ago)
Mount
Through Hole
Mounting Type
Through Hole
Package / Case
TO-247-3
Number of Pins
3
Weight
38.000013g
Operating Temperature
-55°C~175°C TJ
Packaging
Tube
Part Status
Active
Moisture Sensitivity Level (MSL)
1 (Unlimited)
ECCN Code
EAR99
Subcategory
Insulated Gate BIP Transistors
Max Power Dissipation
375W
Peak Reflow Temperature (Cel)
NOT SPECIFIED
[email protected] Reflow Temperature-Max (s)
NOT SPECIFIED
Base Part Number
STGW25
Element Configuration
Single
Input Type
Standard
Power - Max
375W
Polarity/Channel Type
N-CHANNEL
Collector Emitter Voltage (VCEO)
1.2kV
Max Collector Current
50A
Reverse Recovery Time
265 ns
Collector Emitter Breakdown Voltage
1.2kV
Voltage - Collector Emitter Breakdown (Max)
1200V
Collector Emitter Saturation Voltage
1.85V
Test Condition
600V, 25A, 15 Ω, 15V
Vce(on) (Max) @ Vge, Ic
2.3V @ 15V, 25A
IGBT Type
Trench Field Stop
Gate Charge
85nC
Current - Collector Pulsed (Icm)
100A
Td (on/off) @ 25°C
28ns/150ns
Switching Energy
850μJ (on), 1.3mJ (off)
Gate-Emitter Voltage-Max
20V
Gate-Emitter Thr Voltage-Max
7V
REACH SVHC
No SVHC
RoHS Status
ROHS3 Compliant
Lead Free
Lead Free
Pricing & Ordering
Quantity
Unit Price
Ext. Price
1
$8.725040
$8.72504
10
$8.231170
$82.3117
100
$7.765255
$776.5255
500
$7.325712
$3662.856
1000
$6.911049
$6911.049
STGW25M120DF3 Product Details
Description
The STGW25M120DF3 is a 1200 V, 25 A, low-loss M series Trench gate field-stop IGBT in a TO-247 package. This STGW25M120DF3 device is an IGBT with a trench gate field stop construction developed in-house. The device is part of the M series of IGBTs, which provide an ideal blend of inverter system performance and efficiency in applications where low-loss and short-circuit functionality are critical. Furthermore, the narrow parameter distribution and positive VCE(sat) temperature coefficient result in a safer paralleling operation.