SN74LVTH374NSR Overview

The flip flop is packaged in a case of 20-SOIC (0.209, 5.30mm Width). D flip flop is embedded in the Tape & Reel (TR) package. There is a Tri-State, Non-Invertedoutput configured with it. There is a trigger configured with Positive Edge. Surface Mountis positioned in the way of this electronic part. The JK flip flop operates at a voltage of 2.7V~3.6V. In this case, the operating temperature is -40°C~85°C TA. The type of this D latch is D-Type. It belongs to the 74LVTHseries of FPGAs. You should not exceed 150MHzin the output frequency of the device. D latch consists of 1 elements. It consumes 190μA of quiescent 20terminations have occurred. You can search similar parts based on 74LVTH374. Power is provided by a 3.3V supply. The input capacitance of this JK flip flopis 3pF farads. Electronic devices of this type belong to the LVTfamily. Electronic part Surface Mountis mounted in the way. It is designed with 20 pins. A Positive Edgeclock edge trigger is used in this device. This device is part of the FF/Latchesbase part number family. It is designed with a number of bits of 8. It is imperative that the supply voltage (Vsup) is maintained above 2.7Vin order to ensure normal operation. Its superior flexibility is attributed to its use of 8 circuits. In view of its reliability, this D flip flop is a good fit for TR. The flip flop contains 2ports. For high efficiency, the supply voltage should be kept at 3.3V. Its output current of 64mAallows for maximum design flexibility. There are 3 output Lines, which generate the binary equivalent of the input line whose value is equal to “1” and are available to encode either a decimal or hexadecimal input pattern to typically a binary or “B. C. D” (binary coded decimal) output code.

SN74LVTH374NSR Features

Tape & Reel (TR) package
74LVTH series
20 pins
8 Bits

SN74LVTH374NSR Applications

There are a lot of Texas Instruments SN74LVTH374NSR Flip Flops applications.

• Registers
• Pattern generators
• Automotive
• Shift Registers
• Consumer
• High Performance Logic for test systems
• Bus hold
• Reduced system switching noise
• Bounce elimination switch
• Control circuits